Simon, Paul. — Yield modeling for deep sub-micron IC design.
Nijmegen : Arts & Boeve, 2001. Paperback. xi, 193 pp. Thesis Technische Universiteit Eindhoven. Mailorder only - Alleen verzending mogelijk. Book condition : very good. ISBN 9789075341287.
Machine translation by Google. The original description of the seller is leading.
Log in or create an account to translate descriptions. Accedi
Numero libro:
#243342
€12.00 ($13.23 | £10.01 | ¥2,112)