AMERASEKERA, E.A., & CAMPBELL, D.S. — Failure Mechanisms in Semiconductor Devices.
Prima edizione
Chichester: John Wiley & Sons, 1987. 1st ed. "All the major aspects of semiconductor device reliability receive coverage in this text." Pp. 13/205, figures and diagrams throughout, fep top corner clipped. Illustrated laminated boards. G+.
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Numero libro:
24172
£25.00 (€29.97 | $33.03 | ¥5,274)